Test Sockets Use List │ Products & Services │ YAMAICHI ELECTRONICS

Probe Card

Use List

Offering optimal solutions for diversified packages and test specifications with our design and production know-how cultivated with test burn-in sockets.

1-1(Total 1 Count)


Custom-made socket

Using spring probe pins for various packages, such as BGA, LGA, QFP, SOP, QFN, and SON. Socket can be customized and developed according to customer requirement.
Supporting Kelvin contact, image sensor and PoP applications that require contact at top and bottom sides of IC package.
For details, please contact Yamaichi representative.

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Burn-in Sockets
Test Sockets
Probe Card